[UAH] Attn: UG Scientists & Innovators Measuring Complex Materials and their Components Seminar 2013
|
5:29 AM |
No comments |
Measuring Complex Materials and their Components Seminar 2013
Seminar | Where & When
Join Agilent Technologies at this complimentary full day seminar with guest speakers from the University of Cambridge and our partner, Thomas Keating.
Engineers and Researchers working today in education, communications, wireless, aerospace and defence industries with functional, novel materials and their components are faced with increasingly complex measurement challenges and rapidly changing technology. A strong understanding in measurement techniques is essential for success.
Agilent will provide a FREE day-long seminar covering the fundamentals of impedance measurements, techniques of characterizing complex materials, how to measure material/component properties in nano-scale resolution and concluding with a session focused on emerging novel materials research challenges. Special guest speaker from the Cambridge Graphene Centre, Dr. Shakil A Awan, will be sharing his thoughts on measurement challengesand research on graphene. Application and product experts from Agilent will be on-hand to give demonstrations and technical presentations around the latest innovations, features and capabilities. You will also get the chance to book a 1-1 session with the experts to discuss your application on a first come first served basis (Limited Spaces available)
Who should attend: R&D, QA, Design and Manufacturing Engineers. Researchers who are working with materials and designing state-of-the-art electronic devices and components.
| 8:30 - 9:00 AM | Registration | |
| 9:00 – 9:05 AM | Introduction | |
| 9:05 – 10:30 AM | Challenges and Solutions for Impedance Measurements - Will Attoh (Application Engineer at Agilent Technologies) |  |
| 10:30 – 10:45 AM | Break | |
| 10:45 – 12:00 AM | Dielectric Characterization of Materials- Clive Barnett (Application Engineer at Agilent Technologies) |  |
| 12:00 – 1:00 PM | Lunch and Hands-On Demo Session | |
| 1:00 – 1:45 PM | Quasi Optical Systems to determine complex material properties-Kevin Pike (Project Scientist at TK Instruments) |  |
| 1:45 – 2:30 PM | Expanding Impedance Measurement to Nanoscale - Dr Matthias Fenner(Application Engineer, Agilent Technologies) |  |
| 2:30 – 2:50 PM | Break | |
| 2:50 – 3:30 PM | Graphene fabrication and characterisation by Dr. Shakil A Awan and Antonio Lombardo from the Cambridge Research Centre and in the Nanomaterials and Spectroscopy Group. |  |
| 3:30 – 4:15 PM | Agilent's Role in Novel Materials Research: Techniques to characterize graphene and graphene-based devices - Dr. Stewart Wilson (European Business Manager for Parametric Test Equipment, Agilent) |  |
| 4:15 – 5:30 PM | (Optional) Coffee and discussion with Specialists/ Hands-on with Instruments | |
Application Clinic
"Throughout the day we will be running personal and specialized drop-in sessions with our team of application engineers. They will be able to discuss your application and measurement challenges, or run a special hands-on session with test and measurement equipment.
Each session will last approximately 20 minutes and registration for the Application Clinic is on a first-come, first-served basis, with a limited amount of time slots."
Abstracts
• Challenges and Solutions for Impedance Measurements - Will Attoh (Application Engineer at Agilent Technologies)
This session is aimed to focus on basics impedance measurement and its applications. Also, the correct techniques for making accurate impedance measurements on components such as capacitors, inductors and other specialized applications will be discussed. You will gain an understanding on the reasons for measurement discrepancies, the sources of measurement error and how to compensate for these errors. A discussion on the advantages and disadvantages of the different measurement techniques employed will assist you in selecting the right instrument for your measurement need.
• Dielectric Characterization of Materials- Clive Barnett (Application Engineer at Agilent Technologies)
Evaluation of the electrical characteristics of materials is very important to develop new devices or to improve the performance. Join this session to help you understand choosing the right technique and test setup considerations are crucial aspects for your research. The presenter will introduce portable and cost-effective dielectric spectroscopy solution. Popular applications such as Phantom SAR test, PCB and substrates, free space measurement and food quality evaluation will all be discussed.
• Quasi Optical Systems to determine complex material properties
Thomas Keating has long been associated with Quasi-Optical Measurement systems. A free-space measurement system will be presented, which when combined with the current generation of Agilent's VNA's and analysis software provides a powerful measurement tool for the determination of complex material properties.
• Expanding Impedance Measurement to Nanoscale - Dr Matthias Fenner(Application Engineer, Agilent Technologies)
SMM Mode is the only AFM-based electrical characterization technique that affords researchers true calibrated capacitance. It enables complex impedance (resistance and reactance), calibrated capacitance, calibrated dopant density, and topography measurements. From applications such as semiconductors,ceramics or polymers to biological samples, characterization of interfacial properties and contrast from molecular vibrational modes, this session is aimed to give you a better understanding of how you can implement SMM onto your application area.
• Graphene fabrication and characterisation by Dr. Shakil A Awan and Antonio Lombardo (Cambridge Research Centre and in the Nanomaterials and Spectroscopy Group)
Join our Guest Speakers from the University of Cambridge who will give a short talk on their work with the novel material graphene and their measurement challenges.
• Agilent's Role in Novel Materials Research: Techniques to characterize graphene and graphene-based devices - Dr. Stewart Wilson (European Business Manager for Parametric Test Equipment, Agilent)
A surge in research into the novel material graphene reveals an intensifying global contest to lead a potential industrial revolution. Agilent Technologies continues to develop and introduce test and measurement equipment to cope up with the evolving demands of researchers. The presenter will discuss how to characterize and measure properties on novel materials like graphene. The presenter will cover how to make frequency domain measurements from DC to 1THz, measuring electromagnetic interference (EMI) and characterising Carbon or Graphene Nano-Tubes/FETs or SETs.
Where & When
| Date(s) | Location | For more information |
|---|---|---|
| 2013-07-16 08:45 — 16:45 Local Time | Winnersh | Register now |
Enroll in myAgilent
Register Your Product
Why Buy Agilent
0 comments:
Post a Comment